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中文核心期刊

高次谐波体声波谐振器机械品质因数的谐振谱特性

Resonance spectrum characteristics of mechanical quality factor of high-overtone bulk acoustic resonator

  • 摘要: 高次谐波体声波谐振器(High-overtone Bulk Acoustic Resonator,HBAR)是由基底、压电薄膜及上下电极所组成的器件,它具有高的品质因数Q和多模谐振频谱特性.从给出HBAR的谐振谱出发,以各层的结构(厚度)和材料特性(特性阻抗和机械衰减因子)为参数,系统研究了机械品质因数QM的谐振谱特性。QM随基底或压电薄膜的厚度变化表现为一系列对应不同阶数的曲线。在给定频率下,QM随基底厚度的增加振荡上升,且最终趋于基底材料的机械品质因数,而其随压电薄膜厚度的增加呈波浪式下降。对于给定结构的HBAR,QM随频率(阶数)的增加呈波浪式下降。此外,考虑电极的厚度对QM的变化规律影响不大。为了获得较大的QM,应选择Al/AlN/Al/Sapphire或YAG结构的HBAR,且基底要较厚,压电薄膜和电极厚度要适中。

     

    Abstract: A High-overtone Bulk Acoustic Resonator (HBAR) consisting of a piezoelectric film with two electrodes on a substrate exhibits high quality factor (Q) and multi-mode resonance spectrum.The resonance spectrum of the HBAR is given,then the resonance spectrum characteristics of mechanical quality factor (QM) are analyzed by taking each layer's structure (thickness) and material properties (characteristic impedance and mechanical attenuation factor) into account.The relationship between QM and the thickness of the substrate or piezoelectric film is shown by a series of curves corresponding to different modes.QM at a certain frequency increases with the oscillatory behavior as the substrate thickness increases,and eventually tends to the mechanical quality factor of the substrate,while it decreases in a wave-like changes as the piezoelectric film thickness increases.QM decreases as the frequency or number of mode increases for a given HBAR.In addition,it has little effect on the variation rules as considering the thickness of the electrode.In order to obtain larger QM,the structure of Al/AIN/Al/Sapphire or YAG with appropriate thickness of the substrate,piezoelectric film and electrode should be selected.

     

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